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[IEEE 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009) - Sesimbra-Lisbon, Portugal (2009.06.24-2009.06.26)] 2009 15th IEEE International On-Line Testing Symposium - Detectability analysis of small delays due to resistive opens considering process variations
Garcia-Gervacio, Jose L., Champac, VictorYear:
2009
Language:
english
DOI:
10.1109/iolts.2009.5196011
File:
PDF, 139 KB
english, 2009