[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Corona: Ring-based interconnected topology for on-chip network
Bahmani, Maryam, Reshadi, Midia, Khademzadeh, Ahmad, Reza, AkramYear:
2008
Language:
english
DOI:
10.1109/idt.2008.4802497
File:
PDF, 288 KB
english, 2008