Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2008 Vol. 266; Iss. 21
PIXE as a complement to trace metal analysis of sediments by ICP-OES
J.M. Lunderberg, R.J. Bartlett, A.M. Behm, C. Contreras, P.A. DeYoung, N.L. Hoogeveen, A.J. Huisman, G.F. Peaslee, J.K. PostmaVolume:
266
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.nimb.2008.07.025
File:
PDF, 197 KB
english, 2008