Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2009 Vol. 267; Iss. 3
On the understanding of positive and negative ionization processes during ToF-SIMS depth profiling by co-sputtering with cesium and xenon
J. Brison, J. Guillot, B. Douhard, R.G. Vitchev, H.-N. Migeon, L. HoussiauVolume:
267
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.nimb.2008.11.026
File:
PDF, 476 KB
english, 2009