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[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Examining the effect of source type on the accuracy of inverse distance fall-off for radiated EMI measurements
Maas, John, Connor, Samuel, Hoolihan, DanielYear:
2011
Language:
english
DOI:
10.1109/isemc.2011.6038362
File:
PDF, 1.52 MB
english, 2011