Comparative study of transient current induced in SiC p+n...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2009 Vol. 267; Iss. 12-13

Comparative study of transient current induced in SiC p+n and n+p diodes by heavy ion micro beams

Takeshi Ohshima, Naoya Iwamoto, Shinobu Onoda, Tomihiro Kamiya, Katsuyasu Kawano
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Volume:
267
Year:
2009
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2009.03.056
File:
PDF, 310 KB
english, 2009
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