![](/img/cover-not-exists.png)
[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Built in Self Test Based Design of Wave-Pipelined Circuits in ASICs
Vireen, V., Venugopalachary, N., Seetharaman, G., Venkataramani, B.Year:
2009
Language:
english
DOI:
10.1109/vlsi.design.2009.46
File:
PDF, 486 KB
english, 2009