[IEEE IEEE Custom Integrated Circuits Conference - CICC '94 - San Diego, CA, USA (1-4 May 1994)] Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94 - iRULE: fast hot-carrier reliability diagnosis using macro-models
Chin-Chi Teng,, Weishi Sun,, Sung-Mo Kang,, Peng Fang,, Yue, J.Year:
1994
Language:
english
DOI:
10.1109/cicc.1994.379689
File:
PDF, 354 KB
english, 1994