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[IEEE 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsin Chu, Taiwan (2010.04.26-2010.04.29)] Proceedings of 2010 International Symposium on VLSI Design, Automation and Test - Optimum leakage dynamic array design
Bajkowski, Maciej, Giao Pham,, Vepadharmalingam, MuraliYear:
2010
Language:
english
DOI:
10.1109/vdat.2010.5496739
File:
PDF, 626 KB
english, 2010