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Analyzing artifacts in the time domain waveform to locate wire faults
Parkey, Charna, Hughes, Craig, Locken, NicholasVolume:
15
Language:
english
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/mim.2012.6263978
Date:
August, 2012
File:
PDF, 3.71 MB
english, 2012