Ion-scattering analysis of self-assembled monolayers of...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2010 Vol. 268; Iss. 11-12

Ion-scattering analysis of self-assembled monolayers of silanes on organic semiconductors

Leszek S. Wielunski, S. Katalinic, B. Lee, M. Connors, E. Garfunkel, L.C. Feldman, V. Podzorov
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Volume:
268
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2010.02.050
File:
PDF, 408 KB
english, 2010
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