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[IEEE 1996 46th Electronic Components and Technology Conference - Orlando, FL, USA (28-31 May 1996)] 1996 Proceedings 46th Electronic Components and Technology Conference - Characterization of the fatigue properties of bonding wires
Deyhim, A., Yost, B., Mirng-Ji Lii,, Che-Yu Li,Year:
1996
Language:
english
DOI:
10.1109/ectc.1996.550505
File:
PDF, 478 KB
english, 1996