Design for Testability of CMOS Analog Sum-Product...

IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing 2007 / 08 Vol. 54; Iss. 8

Design for Testability of CMOS Analog Sum-Product Error-Control Decoders

Yiu, Mimi, Winstead, Chris, Gaudet, Vincent, Schlegel, Christian
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/tcsii.2007.898472
Date:
August, 2007
File:
PDF, 883 KB
english, 2007
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