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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Error Analysis for the Support of Robust Voltage Scaling
Roberts, D., Austin, T., Blauww, D., Mudge, T., Flautner, K.Year:
2005
Language:
english
DOI:
10.1109/isqed.2005.53
File:
PDF, 146 KB
english, 2005