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[IEEE ASP-DAC 2005. Asia and South Pacific Design Automation Conference 2005 - Shanghai, China (18-21 Jan. 2005)] Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. - Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs
Reddy, E.S.S., Sashikanth, V.C.M., Kamakoti, V.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/aspdac.2005.1466557
File:
PDF, 759 KB
english, 2005