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[IEEE 2008 Third International Conference on Digital Information Management (ICDIM) - London, United Kingdom (2008.11.13-2008.11.16)] 2008 Third International Conference on Digital Information Management - Two pattern classifiers for interval data based on binary regression models
de Souza, Renata M.C.R., Cysneiros, Francisco Jose de A., Queiroz, Diego C.F., Fagundes, Roberta A.A.Year:
2008
Language:
english
DOI:
10.1109/icdim.2008.4746705
File:
PDF, 237 KB
english, 2008