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[IEEE 2007 IEEE Conference on Emerging Technologies & Factory Automation (EFTA 2007) - Patras, Greece (2007.09.25-2007.09.28)] 2007 IEEE Conference on Emerging Technologies & Factory Automation (EFTA 2007) - Sensitization of symbolic runs in real-time testing using the ORIS tool
Carnevali, Laura, Sassoli, Luigi, Vicario, EnricoYear:
2007
Language:
english
DOI:
10.1109/efta.2007.4416757
File:
PDF, 212 KB
english, 2007