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[IEEE 2013 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2013.4.22-2013.4.24)] 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT) - Sensorless dead-time exploration for digitally controlled switching converters
Bo-Ting Yeh,, Chun-Hung Yang,, Kai-Cheung Juang,, Chien-Hung Tsai,Year:
2013
Language:
english
DOI:
10.1109/vldi-dat.2013.6533802
File:
PDF, 803 KB
english, 2013