![](/img/cover-not-exists.png)
[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - ELF-Murphy data on defects and test sets
McCluskey, E.J., Al-Yamani, A., Li, J.C.-M., Chao-Wen Tseng,, Volkerink, E., Ferhani, F.-F., Li, E., Mitra, S.Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299220
File:
PDF, 1.34 MB
english, 2004