[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley,...

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[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - ELF-Murphy data on defects and test sets

McCluskey, E.J., Al-Yamani, A., Li, J.C.-M., Chao-Wen Tseng,, Volkerink, E., Ferhani, F.-F., Li, E., Mitra, S.
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Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299220
File:
PDF, 1.34 MB
english, 2004
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