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[IEEE IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging - Cambridge, MA, USA (29-31 Oct. 2001)] IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565) - Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements
Woopoung Kim,, Seock Hee Lee,, Swaminathan, M., Tummala, R.R.Year:
2001
Language:
english
DOI:
10.1109/epep.2001.967624
File:
PDF, 424 KB
english, 2001