[IEEE 2011 IEEE International Symposium on Defect and Fault...

  • Main
  • [IEEE 2011 IEEE International Symposium...

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors

Chapman, Glenn H., Gray, Bonnie L., Jain, Vijay K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2011
Language:
english
DOI:
10.1109/dft.2011.33
File:
PDF, 1.09 MB
english, 2011
Conversion to is in progress
Conversion to is failed