[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Creating Defect Tolerance in Microfluidic Capacitive/Photonic Biosensors
Chapman, Glenn H., Gray, Bonnie L., Jain, Vijay K.Year:
2011
Language:
english
DOI:
10.1109/dft.2011.33
File:
PDF, 1.09 MB
english, 2011