Automated Four-Point Probe Measurement of Nanowires Inside...

IEEE Transactions on Nanotechnology 2011 / 07 Vol. 10; Iss. 4

Automated Four-Point Probe Measurement of Nanowires Inside a Scanning Electron Microscope

Changhai Ru,, Yong Zhang,, Yu Sun,, Yu Zhong,, Xueliang Sun,, Hoyle, D., Cotton, I.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2010.2065236
Date:
July, 2011
File:
PDF, 626 KB
english, 2011
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