Volatile resistance states in electrochemical metallization cells enabling non-destructive readout of complementary resistive switches
van den Hurk, Jan, Linn, Eike, Zhang, Hehe, Waser, Rainer, Valov, IliaVolume:
25
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/25/42/425202
Date:
October, 2014
File:
PDF, 647 KB
english, 2014