[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Innovative practices session 2C: Memory test
Dixit, Charutosh, Tekumalla, Ramesh, Chakravarty, Sreejit, Dixit, Charutosh, D'Abreu, Manuel, Bao, Zhuoyu, Riccobene, ConcettaYear:
2013
Language:
english
DOI:
10.1109/vts.2013.6548892
File:
PDF, 60 KB
english, 2013