[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing
Ding, Weichi, Pan, Mingde, Wong, Wilson, Chow, Daniel, Li, Mike Peng, Shumarayev, SergeyYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401536
File:
PDF, 516 KB
english, 2012