[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Case studied of failure threat caused by counterfeit plastic encapsulated microcircuits
Wang, Y.L, Kuang, XJ, Huang, CM, Li, S.PYear:
2013
DOI:
10.1109/ipfa.2013.6599226
File:
PDF, 657 KB
2013