Combined effect of X-irradiation and forming gas anneal on...

IEEE Transactions on Nuclear Science 1993 / Dec. Vol. 40; Iss. 6

Combined effect of X-irradiation and forming gas anneal on the hot-carrier response of MOS oxides

Milanowski, R.J., Pagey, M.P., Matta, A.I., Bhuva, B.L., Massengill, L.W., Kerns, S.E.
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Volume:
40
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.273531
Date:
January, 1993
File:
PDF, 693 KB
english, 1993
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