[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Ab initio method for electromigration analysis
Ceric, H., De Orio, R. L., Zisser, W. H., Selberherr, S.Year:
2012
Language:
english
DOI:
10.1109/ipfa.2012.6306306
File:
PDF, 738 KB
english, 2012