A technique for positioning nanoparticles using an atomic...

Nanotechnology 1998 / 12 Vol. 9; Iss. 4

A technique for positioning nanoparticles using an atomic force microscope

Hansen, L Theil, Kühle, A, Sørensen, A H, Bohr, J, Lindelof, P E
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Volume:
9
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/9/4/006
Date:
December, 1998
File:
PDF, 223 KB
english, 1998
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