[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - Diagnosis of Realistic Defects Based on the X-Fault Model
Polian, Ilia, Nakamura, Yusuke, Engelke, Piet, Spinner, Stefan, Miyase, Kohei, Kajihara, Seiji, Becker, Bernd, Wen, XiaoqingYear:
2008
Language:
english
DOI:
10.1109/ddecs.2008.4538798
File:
PDF, 470 KB
english, 2008