[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Efficient output ESD protection for 0.5-μm high-speed CMOS SRAM IC with well-coupled technique
Ming-Dou Ker,, Chau-Neng Wu,Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888203
File:
PDF, 305 KB
english, 1996