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[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - A new data retention mechanism after endurance stress on flash memory
Kameyama, H., Okuyama, Y., Kamohara, S., Kubota, K., Kume, H., Okuyama, K., Manabe, Y., Nozoe, A., Uchida, H., Hidaka, M., Ogura, K.Year:
2000
Language:
english
DOI:
10.1109/relphy.2000.843914
File:
PDF, 504 KB
english, 2000