[IEEE 2012 IEEE International Reliability Physics Symposium...

  • Main
  • [IEEE 2012 IEEE International...

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Design and fabrication of SiGe MEMS structures with high intrinsic ESD robustness

Sangameswaran, Sandeep, Cherman, Vladimir, De Coster, Jeroen, Witvrouw, Ann, Groeseneken, Guido, De Wolf, Ingrid
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/irps.2012.6241822
File:
PDF, 2.64 MB
english, 2012
Conversion to is in progress
Conversion to is failed