[IEEE 2008 IEEE Conference on Cybernetics and Intelligent Systems (CIS) - Chengdu, China (2008.09.21-2008.09.24)] 2008 IEEE Conference on Cybernetics and Intelligent Systems - The SVM classification leafminer-infected leaves based on fractal dimension
Da-ke Wu,, Chun-yan Xie,, Cheng-wei Ma,Year:
2008
Language:
english
DOI:
10.1109/iccis.2008.4670815
File:
PDF, 391 KB
english, 2008