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[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Reduction of Fault Latency in Sequential Circuits by using Decomposition
Levin, Ilya, Abramov, Benjamin, Ostrovsky, VladimirYear:
2007
Language:
english
DOI:
10.1109/dft.2007.24
File:
PDF, 316 KB
english, 2007