[IEEE 2008 IEEE International Symposium on Consumer Electronics - (ISCE 2008) - Vilamoura, Portugal (2008.04.14-2008.04.16)] 2008 IEEE International Symposium on Consumer Electronics - Auto flash performance test using exposure accuracy
Park, Kwang Yeol, Park, Hyung Ju, Young Ho Son,, Dong Hwan Har,Year:
2008
Language:
english
DOI:
10.1109/isce.2008.4559453
File:
PDF, 1.19 MB
english, 2008