[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Ageing under illumination of MOS transistors for active pixel sensors (APS) applications
Lopez, Diana, Monsieur, Frederic, Balestra, FrancisYear:
2008
Language:
english
DOI:
10.1109/irws.2008.4796127
File:
PDF, 417 KB
english, 2008