[IEEE 2008 IEEE International Integrated Reliability...

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[IEEE 2008 IEEE International Integrated Reliability Workshop Final Report (IRW) - South lake Tahoe, CA, USA (2008.10.12-2008.10.16)] 2008 IEEE International Integrated Reliability Workshop Final Report - Ageing under illumination of MOS transistors for active pixel sensors (APS) applications

Lopez, Diana, Monsieur, Frederic, Balestra, Francis
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Year:
2008
Language:
english
DOI:
10.1109/irws.2008.4796127
File:
PDF, 417 KB
english, 2008
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