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[IEEE 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Windsor, United Kingdom (2009.09.4-2009.09.6)] 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques - Test Generation with Context Free Grammars and Covering Arrays

Hoffman, Daniel, Sobotkiewicz, Lewis, Wang, Hong-Yi, Strooper, Paul, Bazdell, Gary, Stevens, Brett
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Year:
2009
Language:
english
DOI:
10.1109/taicpart.2009.35
File:
PDF, 149 KB
english, 2009
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