Conduction Mechanism of Leakage Current in Thermal Oxide on...

Materials Science Forum 2014 / 2 Vol. 778-780

Conduction Mechanism of Leakage Current in Thermal Oxide on 4H-SiC

Sometani, Mitsuru, Okamoto, Dai, Harada, Shinsuke, Ishimori, Hitoshi, Takasu, Shinji, Hatakeyama, Tetsuo, Takei, Manabu, Yonezawa, Yoshiyuki, Fukuda, Kenji, Okumura, Hajime
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
778-780
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.778-780.579
Date:
February, 2014
File:
PDF, 396 KB
english, 2014
Conversion to is in progress
Conversion to is failed