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[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - Shared Execution for Efficiently Testing Product Lines
Kim, Chang Hwan Peter, Khurshid, Sarfraz, Batory, DonYear:
2012
Language:
english
DOI:
10.1109/issre.2012.23
File:
PDF, 380 KB
english, 2012