[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Optimally minimizing overlay violation in self-aligned double patterning decomposition for row-based standard cell layout in polynomial time
Xiao, Zigang, Du, Yuelin, Tian, Haitong, Wong, Martin D.F.Year:
2013
Language:
english
DOI:
10.1109/iccad.2013.6691094
File:
PDF, 1.06 MB
english, 2013