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[IEEE 2007 69th ARFTG Conference - Honolulu, HI, USA (2007.06.8-2007.06.8)] 2007 69th ARFTG Conference - A new technique for measuring the resonant behavior of power amplifier bias circuits
Rumery, Scott, Noori, BasimYear:
2007
Language:
english
DOI:
10.1109/arftg.2007.5456335
File:
PDF, 16.26 MB
english, 2007