Mesoscopic Roughness Characterization of Grown Surfaces by...

Japanese Journal of Applied Physics 1994 / 1 Vol. 33; Iss. Part 2, No

Mesoscopic Roughness Characterization of Grown Surfaces by Atomic Force Microscopy

Yoshinobu, Tatsuo, Iwamoto, Atsushi, Iwasaki, Hiroshi
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Volume:
33
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.33.l67
Date:
January, 1994
File:
PDF, 510 KB
1994
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