Time-Dependent Variability Related to BTI Effects in...

IEEE Transactions on Device and Materials Reliability 2009 / 06 Vol. 9; Iss. 2

Time-Dependent Variability Related to BTI Effects in MOSFETs: Impact on CMOS Differential Amplifiers

Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2019762
Date:
June, 2009
File:
PDF, 515 KB
english, 2009
Conversion to is in progress
Conversion to is failed