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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Novel electromagnetic field measuring instrument with real-time visualization
Rioult, Jean, Seetharamdoo, Divitha, Heddebaut, MarcYear:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284668
File:
PDF, 565 KB
english, 2009