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[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Logic gate threshold voltage controllable single metal gate FinFET CMOS inverters implemented by using co-integration of 3T/4T-FinFETs
Liu, Y. X., Sekigawa, T., Hayashida, T., Matsukawa, T., Endo, K., O'uchi, S., Sakamoto, K., Ishii, K., Tsukada, T., Ishikawa, Y., Yamauchi, H., Ogura, A., Koike, H., Suzuki, E., Masahara, M.Year:
2008
Language:
english
DOI:
10.1109/SOI.2008.4656344
File:
PDF, 561 KB
english, 2008