[IEEE 2008 IEEE International SOI Conference - New Paltz,...

  • Main
  • [IEEE 2008 IEEE International SOI...

[IEEE 2008 IEEE International SOI Conference - New Paltz, NY (2008.10.6-2008.10.9)] 2008 IEEE International SOI Conference - Logic gate threshold voltage controllable single metal gate FinFET CMOS inverters implemented by using co-integration of 3T/4T-FinFETs

Liu, Y. X., Sekigawa, T., Hayashida, T., Matsukawa, T., Endo, K., O'uchi, S., Sakamoto, K., Ishii, K., Tsukada, T., Ishikawa, Y., Yamauchi, H., Ogura, A., Koike, H., Suzuki, E., Masahara, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/SOI.2008.4656344
File:
PDF, 561 KB
english, 2008
Conversion to is in progress
Conversion to is failed