[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Impact of mechanical stress engineering on flicker noise characteristics
Maeda, S., You-Seung Jin,, Jung-A Choi,, Sun-Young Oh,, Hyun-Woo Lee,, Jae-Yoon Yoo,, Min-Chul Sun,, Ja-Hum Ku,, Kwon Lee,, Su-Gon Bae,, Sung-Gun Kang,, Jeong-Hwan Yang,, Young-Wug Kim,, KYear:
2004
Language:
english
DOI:
10.1109/vlsit.2004.1345417
File:
PDF, 181 KB
english, 2004