[IEEE 2007 14th IEEE International Conference on...

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[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Process Variation Aware Comprehensive Layout Synthesis for Yield Enhancement in Nano-meter CMOS

Kurihara, Kenichiro, Iizuka, Tetsuya, Ikeda, Makoto, Asada, Kunihiro
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Year:
2007
DOI:
10.1109/icecs.2007.4511235
File:
PDF, 1017 KB
2007
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