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Piezoresistance Coefficients of (100) Silicon nMOSFETs Measured at Low and High ($\sim$1.5 GPa) Channel Stress
Suthram, S., Ziegert, J. C., Nishida, T., Thompson, S. E.Volume:
28
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2006.887939
Date:
January, 2007
File:
PDF, 288 KB
english, 2007