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[IEEE Conference on Optoelectronic and Microelectronic Materials and Devices, 2004. - Brisbane, Australia (Dec. 2004)] Conference on Optoelectronic and Microelectronic Materials and Devices, 2004. - Constant Capacitance Deep-Level Transient Spectroscopy Study of Bulk Traps and Interface States in P Implanted Si MOS Capacitors
Villis, B.J., McCallum, J.C., Lay, M.D.H., Gauja, E.Year:
2004
Language:
english
DOI:
10.1109/commad.2004.1577505
File:
PDF, 414 KB
english, 2004